LIGHT-EMISSION CHARACTERISTICS AND SURFACE-ROUGHNESS OF AU/ALOX/AL TUNNEL JUNCTION

被引:7
作者
HIRAO, Y
NAOI, Y
NAGANO, Y
FUKUI, M
机构
[1] Department of Electrical, Electronic Engineering, Faculty of Engineering, University of Tokushima
关键词
D O I
10.1143/JPSJ.60.4366
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Emission characteristics of light radiated from a metal-insulator-metal tunnel junction could be controlled by surface and interface roughnesses. To elucidate these situations, surface and interface roughnesses of the tunnel junction are evaluated by a light scattering technique developed by our group. Roughness parameters obtained by such a technique are adopted to calculate the emission characteristics of light radiated from the tunnel junction, compared with experimental emission characteristics. Wavelength spectra of emission intensities are in good agreement, but angular distributions of emission intensities are not.
引用
收藏
页码:4366 / 4373
页数:8
相关论文
共 10 条
[1]  
de Martini F., 1974, POLARITONS, P89
[2]   CHARACTERIZATION OF MULTILAYER ROUGH SURFACES BY USE OF SURFACE-PLASMON SPECTROSCOPY [J].
FONTANA, E ;
PANTELL, RH .
PHYSICAL REVIEW B, 1988, 37 (07) :3164-3182
[3]   LIGHT-EMISSION FROM INELASTIC ELECTRON-TUNNELING [J].
LAMBE, J ;
MCCARTHY, SL .
PHYSICAL REVIEW LETTERS, 1976, 37 (14) :923-925
[4]  
Mills D., 1982, TUNNELING SPECTROSCO, P121
[5]   INTENSITY OF SURFACE-PLASMON POLARITON ENERGY EMITTED INTO THE AIR SIDE IN AN AIR AG-FILM PRISM CONFIGURATION [J].
NAOI, Y ;
FUKUI, M .
PHYSICAL REVIEW B, 1990, 42 (08) :5009-5012
[6]   EVALUATION OF SURFACE-ROUGHNESS PARAMETERS OF METAL-FILMS BY LIGHT-SCATTERING TECHNIQUE [J].
NAOI, Y ;
FUKUI, M .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1989, 58 (12) :4511-4516
[7]   PRISM-COUPLED LIGHT-EMISSION FROM TUNNEL-JUNCTIONS CONTAINING INTERFACE ROUGHNESS - THEORY [J].
TAKEUCHI, A ;
WATANABE, J ;
UEHARA, Y ;
USHIODA, S .
PHYSICAL REVIEW B, 1988, 38 (18) :12948-12958
[8]   POWER SPECTRA OF SURFACE-ROUGHNESS OF LIGHT-EMITTING TUNNEL-JUNCTIONS MEASURED BY SCANNING TUNNELING MICROSCOPY [J].
TAKEUCHI, K ;
UEHARA, Y ;
USHIODA, S ;
MIKOSHIBA, N ;
MORITA, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :557-560
[9]   PRISM-COUPLED LIGHT-EMISSION FROM TUNNEL-JUNCTIONS CONTAINING INTERFACE ROUGHNESS - EXPERIMENT [J].
WATANABE, J ;
TAKEUCHI, A ;
UEHARA, Y ;
USHIODA, S .
PHYSICAL REVIEW B, 1988, 38 (18) :12959-12965
[10]   INSITU AND REAL-TIME OBSERVATION OF OPTICAL-CONSTANTS OF METAL-FILMS DURING GROWTH [J].
YANO, M ;
FUKUI, M ;
HARAGUCHI, M ;
SHINTANI, Y .
SURFACE SCIENCE, 1990, 227 (1-2) :129-137