共 25 条
- [2] ANDERSEN HH, 1981, TOP APPL PHYS, V47, pCH4
- [3] SPUTTERING STUDIES WITH THE MONTE-CARLO PROGRAM TRIM.SP [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 34 (02): : 73 - 94
- [5] INSTRUMENTAL CROSS-CONTAMINATION IN THE CAMECA IMS-3F SECONDARY ION-MICROSCOPE [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 316 - 318
- [6] DELINE VR, 1985, COMMUNICATION
- [7] ECKSTEIN W, 1985, COMMUNICATION
- [8] ECKSTEIN W, 1981, SPRINGER SERIES CHEM, V17, P157
- [9] ENERGY-DEPENDENCE OF THE TRAPPING OF URANIUM ATOMS BY ALUMINUM-OXIDE SURFACES [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 49 (04): : 195 - 201
- [10] HYDROGEN DEPTH PROFILING USING SIMS - PROBLEMS AND THEIR SOLUTIONS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (01): : 47 - 52