AN EMPIRICAL-MODEL FOR DEVICE DEGRADATION DUE TO HOT-CARRIER INJECTION

被引：401

作者：

TAKEDA, E ^{[1
]}

SUZUKI, N ^{[1
]}

机构：

[1] HITACHI LTD,MUSASHI WORKS,KODAIRA,TOKYO 187,JAPAN

来源：

IEEE ELECTRON DEVICE LETTERS | 1983年 / 4卷 / 04期

关键词：

D O I：

10.1109/EDL.1983.25667

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：111 / 113

页数：3

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