A 360000-PIXEL CHARGE-COUPLED COLOR-IMAGE SENSOR FOR IMAGING PHOTOGRAPHIC NEGATIVE

[1] LATCH-UP AND IMAGE CROSSTALK SUPPRESSION BY INTERNAL GETTERING [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (02) : 225 - 231

[2] DISTRIBUTED RC PROBLEM IN BURIED COLLECTOR CID [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (08) : 1090 - 1092

[3] CHANNEL POTENTIAL AND CHANNEL WIDTH IN NARROW BURIED-CHANNEL MOSFETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (04) : 423 - 429

[4] Heavens O.S., 1955, OPTICAL PROPERTIES T

[5] OPTICAL-PROPERTIES OF HEAVILY DOPED SILICON BETWEEN 1.5 AND 4.1 EV [J]. PHYSICAL REVIEW LETTERS, 1981, 46 (21) : 1414 - 1417

[6] STEADY-STATE PHOTOCARRIER COLLECTION IN SILICON IMAGING DEVICES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (09) : 1123 - 1134

[7] Lee T. H., 1983, International Electron Devices Meeting 1983. Technical Digest, P492

[8] LOSEE DL, 1981, OCT EL SOC M DENV

[9] OPTICAL-PROPERTIES OF PHOSPHORUS-DOPED POLYCRYSTALLINE SILICON LAYERS [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) : 6870 - 6878

[10] ANALYSIS AND MEASUREMENT OF PATTERN NOISE IN COLOR-FILTER ARRAYS FOR IMAGE SENSORS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (08) : 1411 - 1416

[1] LATCH-UP AND IMAGE CROSSTALK SUPPRESSION BY INTERNAL GETTERING [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (02) : 225 - 231

[2] DISTRIBUTED RC PROBLEM IN BURIED COLLECTOR CID [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (08) : 1090 - 1092

[3] CHANNEL POTENTIAL AND CHANNEL WIDTH IN NARROW BURIED-CHANNEL MOSFETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (04) : 423 - 429

[4] Heavens O.S., 1955, OPTICAL PROPERTIES T

[5] OPTICAL-PROPERTIES OF HEAVILY DOPED SILICON BETWEEN 1.5 AND 4.1 EV [J]. PHYSICAL REVIEW LETTERS, 1981, 46 (21) : 1414 - 1417

[6] STEADY-STATE PHOTOCARRIER COLLECTION IN SILICON IMAGING DEVICES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (09) : 1123 - 1134

[7] Lee T. H., 1983, International Electron Devices Meeting 1983. Technical Digest, P492

[8] LOSEE DL, 1981, OCT EL SOC M DENV

[9] OPTICAL-PROPERTIES OF PHOSPHORUS-DOPED POLYCRYSTALLINE SILICON LAYERS [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) : 6870 - 6878

[10] ANALYSIS AND MEASUREMENT OF PATTERN NOISE IN COLOR-FILTER ARRAYS FOR IMAGE SENSORS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (08) : 1411 - 1416