EXPERIMENTAL METHODS FOR DETERMINING LATCHUP PATHS IN INTEGRATED-CIRCUITS

被引：19

作者：

JOHNSTON, AH

BAZE, MP

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1109/TNS.1985.4334105

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4260 / 4265

页数：6

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[7] TRANSIENT RADIATION SCREENING OF SILICON DEVICES USING BACKSIDE LASER IRRADIATION [J].

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[9]

Wolf H., 1971, SEMICONDUCTORS

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