ION MICROSCOPY USING MAGNIFYING ION-TRANSPORT SYSTEMS AND POSITION-SENSITIVE DETECTORS

被引：7

作者：

KLEIN, SS

MUTSAERS, PHA

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 30卷 / 03期

关键词：

D O I：

10.1016/0168-583X(88)90024-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：349 / 355

页数：7

共 28 条

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