SILICON DIOXIDE REACTIVE ION ETCHING DEPENDENCE ON SHEATH VOLTAGE

被引:17
作者
FORTUNO, G
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期
关键词
D O I
10.1116/1.573841
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
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页码:744 / 747
页数:4
相关论文
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    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (03) : 464 - 469
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