共 19 条
[3]
Hofmann S., 1980, Surface and Interface Analysis, V2, P148, DOI 10.1002/sia.740020406
[4]
Jurela Z., 1973, Radiation Effects, V19, P175, DOI 10.1080/00337577308232239
[5]
KATO S, 1982, SURF SCI, V123, pL717, DOI 10.1016/0039-6028(82)90121-2
[6]
ENERGY ANALYZED SECONDARY ION MASS-SPECTROSCOPY AND SIMULTANEOUS AUGER AND XPS MEASUREMENTS OF ION BOMBARDED SURFACES
[J].
NUCLEAR INSTRUMENTS & METHODS,
1978, 149 (1-3)
:547-552
[7]
SECONDARY-ION MASS-SPECTROMETRY AND ITS USE IN DEPTH PROFILING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975, 12 (01)
:385-391
[8]
Matsunami N., 1980, IPPJAM14 NAG U I PLA