TEMPERATURE-DEPENDENCE OF 1/F NOISE IN THIN BISMUTH-FILMS

被引：5

作者：

BISSCHOP, J

DEKUIJPER, AH

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1984年 / 55卷 / 05期

关键词：

D O I：

10.1063/1.333224

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1353 / 1358

页数：6

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共 25 条

[21] CONDUCTANCE NOISE INVESTIGATIONS WITH 4 ARBITRARILY SHAPED AND PLACED ELECTRODES [J].

VANDAMME, LKJ ;

VANBOKHOVEN, WMG .

APPLIED PHYSICS, 1977, 14 (02) :205-215

[22] CONCENTRATION, MOBILITY AND 1-F NOISE OF ELECTRONS AND HOLES IN THIN BISMUTH-FILMS [J].

VANDAMME, LKJ ;

KEDZIA, J .

THIN SOLID FILMS, 1980, 65 (03) :283-292

[23] CONDUCTANCE NOISE INVESTIGATIONS ON SYMMETRICAL PLANAR RESISTORS WITH FINITE CONTACTS [J].

VANDAMME, LKJ ;

KUIJPER, AHD .

SOLID-STATE ELECTRONICS, 1979, 22 (11) :981-986

[24] CALCULATIONS OF EXPERIMENTAL IMPLICATIONS OF TENSOR PROPERTIES OF RESISTANCE FLUCTUATIONS [J].

WEISSMAN, MB ;

BLACK, RD ;

SNOW, WM .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (09) :6276-6279

[25] INFLUENCE OF POLYCRYSTALLINE STRUCTURE ON ELECTRIC RESISTANCE OF VAPORIZED NICKEL FILMS [J].

WISSMANN, P .

THIN SOLID FILMS, 1970, 5 (5-6) :329-&