SPUTTERING OF COSI(100) AND COSI2(100) SINGLE-CRYSTAL SURFACES

[1] CHANGES IN THE SURFACE-COMPOSITION OF AG-PD, AU-PD AND CU-PD ALLOYS UNDER ION-BOMBARDMENT [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3): : 541 - 545

[2] BETZ G, 1982, SPUTTERING PARTICLE, V2

[3] X-RAY PHOTOEMISSION STUDY OF INTERACTION OF OXYGEN AND AIR WITH CLEAN COBALT SURFACES [J]. SURFACE SCIENCE, 1976, 60 (02) : 286 - 300

[4] OXYGEN INTERACTION WITH COSI(100) AND COSI2(100) SURFACES [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 621 - 628

[5] MODEL FOR SURFACE-LAYER COMPOSITION CHANGES IN SPUTTERED ALLOYS AND COMPOUNDS [J]. APPLIED PHYSICS LETTERS, 1977, 31 (04) : 259 - 260

[6] Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700

[7] LEED STUDIES OF SURFACE IMPERFECTIONS [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 450 - 469

[8] PREFERRED SPUTTERING ON BINARY ALLOY SURFACES OF THE AL-PD-SISYSTEM [J]. SURFACE SCIENCE, 1979, 85 (01) : 19 - 28

[9] PREFERENTIAL SPUTTERING OF PTSI, NISI2, AND AGAU [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 444 - 448

[10] OXYGEN ON CLEAVED SILICON (111) - EFFECTS OF ATOMIC STEPS AND RESIDUAL GASES [J]. SURFACE SCIENCE, 1980, 92 (2-3) : 407 - 416

[1] CHANGES IN THE SURFACE-COMPOSITION OF AG-PD, AU-PD AND CU-PD ALLOYS UNDER ION-BOMBARDMENT [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3): : 541 - 545

[2] BETZ G, 1982, SPUTTERING PARTICLE, V2

[3] X-RAY PHOTOEMISSION STUDY OF INTERACTION OF OXYGEN AND AIR WITH CLEAN COBALT SURFACES [J]. SURFACE SCIENCE, 1976, 60 (02) : 286 - 300

[4] OXYGEN INTERACTION WITH COSI(100) AND COSI2(100) SURFACES [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 621 - 628

[5] MODEL FOR SURFACE-LAYER COMPOSITION CHANGES IN SPUTTERED ALLOYS AND COMPOUNDS [J]. APPLIED PHYSICS LETTERS, 1977, 31 (04) : 259 - 260

[6] Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700

[7] LEED STUDIES OF SURFACE IMPERFECTIONS [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 450 - 469

[8] PREFERRED SPUTTERING ON BINARY ALLOY SURFACES OF THE AL-PD-SISYSTEM [J]. SURFACE SCIENCE, 1979, 85 (01) : 19 - 28

[9] PREFERENTIAL SPUTTERING OF PTSI, NISI2, AND AGAU [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 444 - 448

[10] OXYGEN ON CLEAVED SILICON (111) - EFFECTS OF ATOMIC STEPS AND RESIDUAL GASES [J]. SURFACE SCIENCE, 1980, 92 (2-3) : 407 - 416