AGGREGATE DEFECTS OF GOLD AND PLATINUM WITH LITHIUM IN SILICON .1. MAGNETIC-RESONANCE INVESTIGATIONS

被引：10

作者：

ALTEHELD, P ^{[1
]}

GREULICHWEBER, S ^{[1
]}

SPAETH, JM ^{[1
]}

WEIHRICH, H ^{[1
]}

OVERHOF, H ^{[1
]}

HOHNE, M ^{[1
]}

机构：

[1] INST KRISTALLZUCHTUNG,D-12489 BERLIN,GERMANY

来源：

PHYSICAL REVIEW B | 1995年 / 52卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.52.4998

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Trigonal and orthorhombic An (Pt) defects in Si additionally doped with Li and P, previously investigated with electron paramagnetic resonance (EPR), are shown to be aggregate defects involving substitutional Au (Pt) and interstitial Li. The small Li hyperfine interactions, not resolved in EPR, could be measured with electron nuclear double resonance (ENDOR). With double ENDOR it is established that the trigonal defects consist of Au-si-Li-3 (Pt-si-Li-3) aggregates, while the orthorhombic defects are Au-si-Li (Pt-si-Li) pair defects. For the trigonal defects the Li hyperfine interaction matrices are asymmetric. The smallness of the Li hyperfine interaction suggests ionic bonding between the interstitial Li ions and the substitutional Au-si (Pt-si) atoms.

引用

页码：4998 / 5006

页数：9

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