STUDIES OF THE AG-GE(100) INTERFACE

被引:53
作者
MILLER, T [1 ]
ROSENWINKEL, E [1 ]
CHIANG, TC [1 ]
机构
[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
来源
PHYSICAL REVIEW B | 1984年 / 30卷 / 02期
关键词
D O I
10.1103/PhysRevB.30.570
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:570 / 577
页数:8
相关论文
共 16 条
[1]   DESORPTION-KINETICS OF CONDENSED PHASES - 2-DIMENSIONAL PHASES OF SILVER ON GE(111) [J].
BERTUCCI, M ;
LELAY, G ;
MANNEVILLE, M ;
KERN, R .
SURFACE SCIENCE, 1979, 85 (02) :471-492
[2]   THE STRUCTURE AND PROPERTIES OF METAL-SEMICONDUCTOR INTERFACES [J].
Brillson, L. J. .
SURFACE SCIENCE REPORTS, 1982, 2 (02) :123-326
[3]   APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J].
BRUNDLE, CR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :212-224
[4]   X-RAY-DIFFRACTION STUDY OF THE GE(001) RECONSTRUCTED SURFACE [J].
EISENBERGER, P ;
MARRA, WC .
PHYSICAL REVIEW LETTERS, 1981, 46 (16) :1081-1084
[5]   THE 2X1 RECONSTRUCTION OF THE GE(001) SURFACE [J].
FERNANDEZ, JC ;
YANG, WS ;
SHIH, HD ;
JONA, F ;
JEPSEN, DW ;
MARCUS, PM .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (03) :L55-L60
[6]   PROBABLE ATOMIC-STRUCTURE OF RECONSTRUCTED SI[001]2X1 SURFACES DETERMINED BY LOW-ENERGY ELECTRON-DIFFRACTION [J].
JONA, F ;
SHIH, HD ;
IGNATIEV, A ;
JEPSEN, DW ;
MARCUS, PM .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (04) :L67-L72
[8]   EPITAXIAL-GROWTH OF AG FILMS ON GE(001) [J].
LINCE, JR ;
NELSON, JG ;
WILLIAMS, RS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03) :553-557
[9]   CRYSTALLOGRAPHIC RELATIONSHIPS AND INTERFACIAL PROPERTIES OF AG ON GAAS(100) SURFACES [J].
LUDEKE, R ;
CHIANG, TC ;
EASTMAN, DE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02) :599-606
[10]   SURFACE CORE-LEVEL SHIFTS FOR GE(100)-(2X1) [J].
MILLER, T ;
ROSENWINKEL, E ;
CHIANG, TC .
SOLID STATE COMMUNICATIONS, 1983, 47 (11) :935-938