MICROSTRUCTURE AND STABILITY OF RF-DIODE SPUTTERED GDTBFECO THIN-FILMS

被引:9
作者
SHIEH, HPD [1 ]
HONG, M [1 ]
NAKAHARA, S [1 ]
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
关键词
D O I
10.1063/1.340692
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:3627 / 3629
页数:3
相关论文
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