BULK GROWTH OF SINGLE-CRYSTAL CUBIC SILICON-CARBIDE BY VACUUM SUBLIMATION METHOD

被引:14
作者
FURUKAWA, K
TAJIMA, Y
SAITO, H
FUJII, Y
SUZUKI, A
NAKAJIMA, S
机构
[1] Central Research Laboratories, Corporate Research and Development Group, Tenri, Nara, 632
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1993年 / 32卷 / 5A期
关键词
CUBIC SILICON CARBIDE; SUBLIMATION; BULK CRYSTAL; DOUBLE POSITIONING BOUNDARIES; SINGLE CRYSTAL;
D O I
10.1143/JJAP.32.L645
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bulk single crystals of cubic silicon carbide up to 4 mm in length have been obtained by means of the modified sublimation method. Growth temperature and pressure were examined in order to increase the growth rate. The temperatures of seed crystal and source material and the temperature gradient were 1750-degrees-C, 2250-degrees-C and 100-degrees-C cm-1, respectively. The pressure was approximately 10(-2) Pa. The growth rate obtained was 0.8 mm -h-1, which is one order of magnitude larger than previously reported values. Raman spectroscopy, reflectoin high-energy electron diffraction analysis and molten KOH etching show that bulk crystals grown on 6H(0001) and 3C(111) seed crystals were 3C(111) single crystals. The crystal on the 6H(0001) showed no double positioning boundaries.
引用
收藏
页码:L645 / L647
页数:3
相关论文
共 19 条
[1]  
FELDMAN DW, 1978, PHYS REV, V173, P787
[2]   3C-SIC P-N-JUNCTION DIODES [J].
FURUKAWA, K ;
UEMOTO, A ;
SHIGETA, M ;
SUZUKI, A ;
NAKAJIMA, S .
APPLIED PHYSICS LETTERS, 1986, 48 (22) :1536-1537
[3]  
FURUKAWA K, 1990, MATER RES SOC SYMP P, V198, P559, DOI 10.1557/PROC-198-559
[4]   EPITAXIAL GROWTH OF SILICON CARBIDE [J].
JENNINGS, VJ ;
SOMMER, A ;
CHANG, HC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (07) :728-&
[5]   CONTROLLED SUBLIMATION GROWTH OF SINGLE CRYSTALLINE 4H-SIC AND 6H-SIC AND IDENTIFICATION OF POLYTYPES BY X-RAY-DIFFRACTION [J].
KANAYA, M ;
TAKAHASHI, J ;
FUJIWARA, Y ;
MORITANI, A .
APPLIED PHYSICS LETTERS, 1991, 58 (01) :56-58
[6]  
Koga K., 1985, 17TH C SOL STAT DEV, P249
[7]  
Kong H. S., 1987, MATER RES SOC S P, V97, P233
[8]   STUDY OF SILICON-CARBIDE EPITAXIAL-GROWTH KINETICS IN THE SIC-C SYSTEM [J].
LILOV, SK ;
TAIROV, YM ;
TSVETKOV, VF .
JOURNAL OF CRYSTAL GROWTH, 1979, 46 (02) :269-273
[9]   EPITAXIAL DEPOSITION OF SILICON-CARBIDE FROM SILICON TETRACHLORIDE AND HEXANE [J].
MUENCH, WV ;
PFAFFENEDER, I .
THIN SOLID FILMS, 1976, 31 (1-2) :39-51
[10]   GROWTH AND PROPERTIES OF BETA-SIC SINGLE CRYSTALS [J].
NELSON, WE ;
HALDEN, FA ;
ROSENGREEN, A .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (01) :333-+