A RADIATION-HARDENED 16/32-BIT MICROPROCESSOR

被引：10

作者：

HASS, KJ

TREECE, RK

GIDDINGS, AE

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/23.45432

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2252 / 2257

页数：6

共 6 条

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[2]

DONHAM BL, 1988, SAND880905

[3] SINGLE EVENT UPSET IN COMBINATORIAL AND SEQUENTIAL CURRENT MODE LOGIC [J].

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LOREE, K .

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[4] SINGLE EVENT UPSET IMMUNE INTEGRATED-CIRCUITS FOR PROJECT GALILEO [J].

GIDDINGS, AE ;

HEWLETT, FW ;

TREECE, RK ;

NICHOLS, DK ;

SMITH, LS ;

ZOUTENDYK, JA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4159-4163

[5] FABRICATION AND TOTAL DOSE TESTING OF A 256KX1 RADIATION HARDENED SRAM [J].

KUSHNER, RA ;

KOHLER, RA ;

STEENWYK, SD ;

DESKO, JC ;

ALCHESKY, LC ;

ARNOLD, RH ;

BENEVIT, CA ;

CLEMONS, DG ;

LONGFELLOW, DA ;

LEE, KH ;

FLORES, RS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1667-1669

[6]

Powell Enoch, COMMUNICATION

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