THE USE OF HISTOGRAMS FOR TRANSMISSION ELECTRON-MICROSCOPY - DEFOCUS AND ASTIGMATISM CORRECTION AT HIGH-RESOLUTION

被引：5

作者：

KRAKOW, W

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1985年 / 2卷 / 04期

关键词：

D O I：

10.1002/jemt.1060020406

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：371 / 387

页数：17

共 15 条

[1] ATKIN P, 1982, 10TH P INT C EL MICR, P525
[2] AN AUTOMATIC FOCUSING AND ASTIGMATISM CORRECTION SYSTEM FOR THE SEM AND CTEM
ERASMUS, SJ
SMITH, KCA
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (AUG): : 185 - 199
[3] ERASMUS SJ, 1982, 10TH P INT C EL MICR, P529
[4] HAASE J, 1970, Z NATURFORSCH PT A, VA 25, P1219
[5] HAASE J, 1970, Z NATURFORSCH PT A, VA 25, P936
[6] ORIGIN OF FRINGE STRUCTURE OBSERVED IN HIGH-RESOLUTION BRIGHT-FIELD ELECTRON-MICROGRAPHS OF AMORPHOUS MATERIALS
KRAKOW, W
AST, DG
GOLDFARB, W
SIEGEL, BM
[J]. PHILOSOPHICAL MAGAZINE, 1976, 33 (06): : 985 - 1014
[7] RASTER METHODS FOR DISPLAYING DEFOCUS AND ASTIGMATISM OF SCANNING ELECTRON-MICROSCOPE IMAGES
KRAKOW, W
[J]. ULTRAMICROSCOPY, 1981, 6 (04) : 387 - 404
[8] KRAKOW W, 1974, OPTIK, V40, P1
[9] KRAKOW W, 1983, 41ST P ANN EMSA M PH, P394
[10] KRAKOW W, 1984, UNPUB J ELECTRON MIC