RASTER METHODS FOR DISPLAYING DEFOCUS AND ASTIGMATISM OF SCANNING ELECTRON-MICROSCOPE IMAGES

被引：1

作者：

KRAKOW, W

机构：

来源：

ULTRAMICROSCOPY | 1981年 / 6卷 / 04期

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D O I：

10.1016/S0304-3991(81)80241-0

中图分类号：

TH742 [显微镜];

学科分类号：

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页码：387 / 404

页数：18

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