AUGER-ELECTRON SPECTROSCOPY FROM ELEMENTAL STANDARDS .3. BACKGROUNDS AND PEAK-TO-BACKGROUND RATIOS

被引：15

作者：

BATCHELOR, DR

BISHOP, HE

VENABLES, JA

机构：

[1] HARWELL LABS,DIV MAT DEV,HARWELL OX11 0RA,OXON,ENGLAND

[2] UNIV SUSSEX,SCH MATH & PHYS SCI,BRIGHTON BN1 9QH,E SUSSEX,ENGLAND

[3] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

SURFACE AND INTERFACE ANALYSIS | 1989年 / 14卷 / 11期

关键词：

D O I：

10.1002/sia.740141106

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：709 / 716

页数：8

共 30 条

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[2] AUGER-ELECTRON SPECTROSCOPY FROM ELEMENTAL STANDARDS .3. BACKGROUNDS AND PEAK-TO-BACKGROUND RATIOS [J].

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[7]

FATHERS DJ, 1984, 1ST P PFEFF C, P193

[8] DIGITAL DATA ACQUISITION, DISPLAY AND ANALYSIS OF SIGNALS FROM SURFACES [J].

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ULTRAMICROSCOPY, 1985, 17 (01) :9-19

[9]

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[10] RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS [J].

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