AUGER CURRENT MEASUREMENTS FOR QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY OF SOLIDS

被引：9

作者：

GRANT, JT

HOOKER, MP

HAAS, TW

机构：

[1] USAF,MAT LAB,WRIGHT PATTERSON AFB,OH 45433

[2] UNIVERSAL ENERGY SYST INC,DAYTON,OH 45432

来源：

JOURNAL OF COLLOID AND INTERFACE SCIENCE | 1976年 / 55卷 / 02期

关键词：

D O I：

10.1016/0021-9797(76)90044-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：370 / 376

页数：7

共 16 条

[1] EFFECT OF MODULATION AMPLITUDE ON ELECTRON-EXCITED AUGER DATA FROM TITANIUM
GRANT, JT
HAAS, TW
HOUSTON, JE
[J]. SURFACE SCIENCE, 1974, 42 (01) : 1 - 11
[2] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES
GRANT, JT
HAAS, TW
HOUSTON, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 227 - 230
[3] USE OF ANALOG INTEGRATION IN DYNAMIC BACKGROUND SUBTRACTION FOR QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY - STUDY OF CO ON MO(110)
GRANT, JT
HOOKER, MP
HAAS, TW
[J]. SURFACE SCIENCE, 1974, 46 (02) : 672 - 675
[4] CHEMICAL EFFECTS IN AUGER-ELECTRON SPECTROSCOPY
HAAS, TW
GRANT, JT
DOOLEY, GJ
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 1853 - &
[5] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS
HARRIS, LA
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &
[6] CHEMICAL EFFECTS IN M4,5NN AUGER SPECTRUM OF MO(110) DUE TO ADSORPTION OF O2 AND CO
HOOKER, MP
GRANT, JT
HAAS, TW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 325 - 328
[7] STUDY OF ADSORPTION OF OXYGEN ON NI(111) USING AUGER-ELECTRON SPECTROSCOPY - CHEMICAL-SHIFTS AND VALENCE SPECTRA
HORGAN, AM
DALINS, I
[J]. SURFACE SCIENCE, 1973, 36 (02) : 526 - 543
[8] STUDY OF EFFECTIVENESS OF STANDARD SURFACE CLEANING TECHNIQUES AS APPLIED TO NI(111), NI(100), AND NI SHEET USING AUGER-ELECTRON SPECTROSCOPY (AES)
HORGAN, AM
DALINS, I
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (04): : 523 - 532
[9] EXACT CORRECTIONS FOR POTENTIAL MODULATION DISTORTION IN AUGER YIELD MEASUREMENTS
HOUSTON, JE
[J]. SURFACE SCIENCE, 1973, 38 (02) : 283 - 291
[10] Kim K.S., 1972, J ELECTRON SPECTROSC, V1, P251, DOI [DOI 10.1016/0368-2048(72)85014-X, DOI 10.1016/S0368-2048(01)00249-3]

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