USE OF ANALOG INTEGRATION IN DYNAMIC BACKGROUND SUBTRACTION FOR QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY - STUDY OF CO ON MO(110)

被引：29

作者：

GRANT, JT

HOOKER, MP

HAAS, TW

机构：

[1] UNIV ENERGY SYST INC,MEDWAY,OH 45341

[2] AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433

来源：

SURFACE SCIENCE | 1974年 / 46卷 / 02期

关键词：

D O I：

10.1016/0039-6028(74)90332-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：672 / 675

页数：4

共 9 条

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[4] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES [J].

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[5] CORRECTIONS OF AUGER-ELECTRON SIGNAL STRENGTHS FOR MODULATION AMPLITUDE DISTORTION IN A 4-GRID RETARDING POTENTIAL-ENERGY ANALYZER [J].

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[6] QUANTITATIVE AUGER ANALYSIS USING INTEGRATION TECHNIQUES [J].

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PHYSICS LETTERS A, 1973, A 45 (04) :309-310

[7] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].

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[8]

HOUSTON JE, 1974, REV SCI INSTRUM, V45, P897, DOI 10.1063/1.1686763

[9] HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER [J].

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