SURFACE CHARACTERIZATION OF COPPER SILICON CATALYSTS

被引:15
作者
SHARMA, AK [1 ]
GUPTA, SK [1 ]
机构
[1] DEF MAT & STORES RES & DEV ESTAB,PB 320,KANPUR 208013,INDIA
关键词
D O I
10.1016/0021-9517(85)90151-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:68 / 74
页数:7
相关论文
共 36 条
[11]   CHEMICAL BONDING AT THE SI-METAL INTERFACE - SI-NI AND SI-CR [J].
FRANCIOSI, A ;
WEAVER, JH ;
ONEILL, DG ;
CHABAL, Y ;
ROWE, JE ;
POATE, JM ;
BISI, O ;
CALANDRA, C .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02) :624-627
[12]  
FRANK TC, 1982, APPL SURF SCI, V14, P359
[13]   ELECTRONIC BEHAVIOR IN ALLOYS - AU-SN [J].
FRIEDMAN, RM ;
HUDIS, J ;
PERLMAN, ML ;
WATSON, RE .
PHYSICAL REVIEW B, 1973, 8 (06) :2433-2440
[14]   OXYGEN IMPURITY EFFECTS AT METAL-SILICIDE INTERFACES - FORMATION OF SILICON-OXIDE AND SUBOXIDES IN THE NI-SI SYSTEM [J].
GRUNTHANER, PJ ;
GRUNTHANER, FJ ;
SCOTT, DM ;
NICOLET, MA ;
MAYER, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :641-648
[15]  
GRUTHANER PJ, 1981, J VAC SCI TECHNOL, V19, P649
[16]   ELECTRONIC-STRUCTURE OF SOME PALLADIUM ALLOYS STUDIED BY ESCA AND X-RAY SPECTROSCOPY [J].
HEDMAN, J ;
NILSSON, R ;
NEMNONOV, SA ;
NORDLING, C ;
TRAPEZNIKOV, VA ;
SOROKINA, MF ;
KLJUSHNIKOV, OI ;
KLASSON, M .
PHYSICA SCRIPTA, 1971, 4 (4-5) :195-+
[17]   ANGLE RESOLVED PHOTOEMISSION MEASUREMENTS ON AG-SI(111) 7X7 INTERFACES [J].
HOUZAY, F ;
GUICHAR, GM ;
CROS, A ;
SALVAN, F ;
PINCHAUX, R ;
DERRIEN, J .
SURFACE SCIENCE, 1983, 124 (01) :L1-L8
[18]   ORGANOSILICIUMVERBINDUNGEN .29. KINETIK DER DIREKTEN SYNTHESE DER METHYLBROMSILANE [J].
JOKLIK, J ;
BAZANT, V ;
KRAUS, M .
COLLECTION OF CZECHOSLOVAK CHEMICAL COMMUNICATIONS, 1962, 27 (04) :974-&
[19]  
KLEBANSKY AL, 1956, J GEN CHEM USSR, V26, P2795
[20]   SURFACE CHARACTERIZATION OF CATALYSTS USING ELECTRON SPECTROSCOPIES - RESULTS OF A ROUND-ROBIN SPONSORED BY ASTM-COMMITTEE D-32 ON CATALYSTS [J].
MADEY, TE ;
WAGNER, CD ;
JOSHI, A .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 10 (04) :359-388