FREQUENCY-RESPONSE OF BIPOLAR JUNCTION TRANSISTORS AFTER ELECTRON-BEAM IRRADIATION

被引:3
作者
JENKINS, KA
机构
关键词
D O I
10.1109/16.34234
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1722 / 1724
页数:3
相关论文
共 7 条
[1]   COMPARISON OF GOLD, PLATINUM, AND ELECTRON-IRRADIATION FOR CONTROLLING LIFETIME IN POWER RECTIFIERS [J].
BALIGA, BJ ;
SUN, E .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (06) :685-688
[2]  
FITZPATRICK J, 1978, MICROWAVE J, V21, P63
[3]   FUNCTION TESTING OF BIPOLAR ICS AND LSIS WITH THE STROBOSCOPIC SCANNING ELECTRON-MICROSCOPE [J].
FUJIOKA, H ;
NAKAMAE, K ;
URA, K .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1980, 15 (02) :177-183
[4]  
Ghandi S K, 1968, THEORY PRACTICE MICR
[5]  
JENKINS KA, 1988, DEC IEDM, P30
[6]  
KEERY WJ, 1976, P WORKSHOP MICROELEC, P507
[7]   SELF-ALIGNED BIPOLAR-TRANSISTORS FOR HIGH-PERFORMANCE AND LOW-POWER-DELAY VLSI [J].
NING, TH ;
ISAAC, RD ;
SOLOMON, PM ;
TANG, DDL ;
YU, HN ;
FETH, GC ;
WIEDMANN, SK .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (09) :1010-1013