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SELF-ALIGNED BIPOLAR-TRANSISTORS FOR HIGH-PERFORMANCE AND LOW-POWER-DELAY VLSI
被引:84
作者
:
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
ISAAC, RD
论文数:
0
引用数:
0
h-index:
0
ISAAC, RD
SOLOMON, PM
论文数:
0
引用数:
0
h-index:
0
SOLOMON, PM
TANG, DDL
论文数:
0
引用数:
0
h-index:
0
TANG, DDL
YU, HN
论文数:
0
引用数:
0
h-index:
0
YU, HN
FETH, GC
论文数:
0
引用数:
0
h-index:
0
FETH, GC
WIEDMANN, SK
论文数:
0
引用数:
0
h-index:
0
WIEDMANN, SK
机构
:
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1981年
/ 28卷
/ 09期
关键词
:
D O I
:
10.1109/T-ED.1981.20476
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1010 / 1013
页数:4
相关论文
共 16 条
[1]
ANANTHA NG, 1979, Patent No. 4160991
[2]
INVESTIGATION OF THE INTRINSIC DELAY (SPEED LIMIT) IN MTL-I2L
BERGER, HH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Laboratories Germany D/3200
BERGER, HH
HELWIG, K
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Laboratories Germany D/3200
HELWIG, K
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 405
-
415
[3]
EFFECT OF CATHODE MATERIALS ON REACTIVE ION ETCHING OF SILICON AND SILICON DIOXIDE IN A CF4 PLASMA
EPHRATH, LM
论文数:
0
引用数:
0
h-index:
0
EPHRATH, LM
[J].
JOURNAL OF ELECTRONIC MATERIALS,
1978,
7
(03)
: 415
-
428
[4]
POLYCRYSTALLINE SILICON AS A DIFFUSION SOURCE AND INTERCONNECT LAYER IN I2L REALIZATIONS
MIDDELHOEK, J
论文数:
0
引用数:
0
h-index:
0
机构:
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
MIDDELHOEK, J
KOOY, A
论文数:
0
引用数:
0
h-index:
0
机构:
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
KOOY, A
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1977,
12
(02)
: 135
-
138
[5]
MURAOKA H, 1973, SEMICONDUCTOR SILICO, P327
[6]
AN ADVANCED PSA TECHNOLOGY FOR HIGH-SPEED BIPOLAR LSI
NAKASHIBA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NAKASHIBA, H
ISHIDA, I
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
ISHIDA, I
AOMURA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
AOMURA, K
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NAKAMURA, T
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1390
-
1394
[7]
EFFECT OF EMITTER CONTACT ON CURRENT GAIN OF SILICON BIPOLAR-DEVICES
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
ISAAC, RD
论文数:
0
引用数:
0
h-index:
0
ISAAC, RD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(11)
: 2051
-
2055
[8]
NING TH, 1979, Patent No. 4157269
[9]
NEW POLYSILICON PROCESS FOR A BIPOLAR DEVICE - PSA TECHNOLOGY
OKADA, K
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
OKADA, K
AOMURA, K
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
AOMURA, K
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
NAKAMURA, T
SHIBA, H
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
SHIBA, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 385
-
389
[10]
RISEMAN J, 1980, Patent No. 4234362
←
1
2
→
共 16 条
[1]
ANANTHA NG, 1979, Patent No. 4160991
[2]
INVESTIGATION OF THE INTRINSIC DELAY (SPEED LIMIT) IN MTL-I2L
BERGER, HH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Laboratories Germany D/3200
BERGER, HH
HELWIG, K
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Laboratories Germany D/3200
HELWIG, K
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 405
-
415
[3]
EFFECT OF CATHODE MATERIALS ON REACTIVE ION ETCHING OF SILICON AND SILICON DIOXIDE IN A CF4 PLASMA
EPHRATH, LM
论文数:
0
引用数:
0
h-index:
0
EPHRATH, LM
[J].
JOURNAL OF ELECTRONIC MATERIALS,
1978,
7
(03)
: 415
-
428
[4]
POLYCRYSTALLINE SILICON AS A DIFFUSION SOURCE AND INTERCONNECT LAYER IN I2L REALIZATIONS
MIDDELHOEK, J
论文数:
0
引用数:
0
h-index:
0
机构:
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
MIDDELHOEK, J
KOOY, A
论文数:
0
引用数:
0
h-index:
0
机构:
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
TWENTE UNIV TECHNOL,SOLID STATE ELECTR GRP,ENSCHEDE,NETHERLANDS
KOOY, A
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1977,
12
(02)
: 135
-
138
[5]
MURAOKA H, 1973, SEMICONDUCTOR SILICO, P327
[6]
AN ADVANCED PSA TECHNOLOGY FOR HIGH-SPEED BIPOLAR LSI
NAKASHIBA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NAKASHIBA, H
ISHIDA, I
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
ISHIDA, I
AOMURA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
AOMURA, K
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NEC TOSHIBA INFORMAT SYST INC,RES LABS,LAB 5,KAWASAKI,JAPAN
NAKAMURA, T
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1390
-
1394
[7]
EFFECT OF EMITTER CONTACT ON CURRENT GAIN OF SILICON BIPOLAR-DEVICES
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
ISAAC, RD
论文数:
0
引用数:
0
h-index:
0
ISAAC, RD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(11)
: 2051
-
2055
[8]
NING TH, 1979, Patent No. 4157269
[9]
NEW POLYSILICON PROCESS FOR A BIPOLAR DEVICE - PSA TECHNOLOGY
OKADA, K
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
OKADA, K
AOMURA, K
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
AOMURA, K
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
NAKAMURA, T
SHIBA, H
论文数:
0
引用数:
0
h-index:
0
机构:
IC Division, Nippon Electric Company, Ltd.
SHIBA, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 385
-
389
[10]
RISEMAN J, 1980, Patent No. 4234362
←
1
2
→