PREPARATION OF N-ZNO/P-SI HETEROJUNCTION BY SOL-GEL PROCESS

被引:46
作者
OKAMURA, T [1 ]
SEKI, Y [1 ]
NAGAKARI, S [1 ]
OKUSHI, H [1 ]
机构
[1] KYOCERA CORP,CENT RES LAB,KAGOSHIMA 89943,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1992年 / 31卷 / 6B期
关键词
ZNO; THIN FILM; SOL-GEL; DIODE; SEMICONDUCTOR; HETEROJUNCTION;
D O I
10.1143/JJAP.31.L762
中图分类号
O59 [应用物理学];
学科分类号
摘要
N-type ZnO thin films with a crack and columnar-free structure were successfully prepared on p-type Si substrates by the sol-gel process. The current-voltage (I-V) characteristics of the heterojunction of n-ZnO/p-Si show a rectification with strong electrical breakdown strength of higher than 10(7) V/cm. The capacitance-voltage (C-V) characteristics show an approximate linear C-2-V relationship in the reverse bias condition. These results indicate that the ZnO films prepared by the sol-gel process are good enough to be used as a semiconducting material in electrical devices.
引用
收藏
页码:L762 / L764
页数:3
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