CAPACITANCE BRIDGE FOR LOW-TEMPERATURE, HIGH-RESOLUTION DIELECTRIC MEASUREMENTS

被引：22

作者：

FOOTE, MC

ANDERSON, AC

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1987年 / 58卷 / 01期

关键词：

D O I：

10.1063/1.1139540

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：130 / 132

页数：3

共 9 条

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[5]

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[6]

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[7] ON AC LOSSES IN THIN-FILM CAPACITORS AT LOW-TEMPERATURES [J].

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[8]

REIJNTJES PJ, UNPUB

[9] THIN-FILM AL/AL2O3/TE METAL-INSULATOR SEMICONDUCTOR CAPACITORS [J].

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