共 18 条
[5]
HAYASHI I, 1980, J PHYS SOC JPN, V49, pA57
[7]
STUDY OF DEFORMATION-PRODUCED DEEP LEVELS IN N-GAAS USING DEEP LEVEL TRANSIENT CAPACITANCE SPECTROSCOPY
[J].
APPLIED PHYSICS,
1980, 21 (03)
:257-261
[9]
EVIDENCE FOR ROLE OF CERTAIN METALLURGICAL FLAWS IN ACCELERATING ELECTROLUMINESCENT DIODE DEGRADATION
[J].
METALLURGICAL TRANSACTIONS,
1970, 1 (03)
:635-&