A COMPARISON OF HEAVY-ION SOURCES USED IN COSMIC-RAY SIMULATION STUDIES OF VLSI CIRCUITS

被引：13

作者：

STEPHEN, JH ^{[1
]}

SANDERSON, TK ^{[1
]}

MAPPER, D ^{[1
]}

FARREN, J ^{[1
]}

HARBOESORENSEN, R ^{[1
]}

ADAMS, L ^{[1
]}

机构：

[1] EUROPEAN SPACE AGCY,EUROPEAN SPACE RES & TECHNOL CTR,2200 AG NOORDWIJK,NETHERLANDS

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1984年 / 31卷 / 06期

关键词：

D O I：

10.1109/TNS.1984.4333457

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1069 / 1072

页数：4

共 11 条

[1]

BAIGET A, 1982, ESA SP179

[2]

BAIGET A, 1982, CNES82QPEFT035 REP

[3]

JACQUET D, 1983, COMMUNICATION

[4] SIMULATION OF COSMIC-RAY INDUCED SOFT ERRORS AND LATCHUP IN INTEGRATED-CIRCUIT COMPUTER MEMORIES [J].

KOLASINSKI, WA ;

BLAKE, JB ;

ANTHONY, JK ;

PRICE, WE ;

SMITH, EC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5087-5091

[5]

LABARTHE A, 1983, ETUDE COMPORTEMENT M

[6] COSMIC-RAY-INDUCED ERRORS IN MOS DEVICES [J].

PICKEL, JC ;

BLANDFORD, JT .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (02) :1006-1015

[7] USE OF A CF-252 SOURCE IN COSMIC-RAY SIMULATION STUDIES ON CMOS MEMORIES [J].

SANDERSON, TK ;

MAPPER, D ;

STEPHEN, JH ;

FARREN, J .

ELECTRONICS LETTERS, 1983, 19 (10) :373-374

[8]

SANDERSON TK, 1984, UKAEA AERER11386 REP

[9] COSMIC-RAY SIMULATION EXPERIMENTS FOR THE STUDY OF SINGLE EVENT UPSETS AND LATCH-UP IN CMOS MEMORIES [J].

STEPHEN, JH ;

SANDERSON, TK ;

MAPPER, D ;

FARREN, J ;

HARBOESORENSEN, R ;

ADAMS, L .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4464-4469

[10] INVESTIGATION OF HEAVY PARTICLE INDUCED LATCH-UP, USING A CF-252 SOURCE, IN CMOS SRAMS AND PROMS [J].

STEPHEN, JH ;

SANDERSON, TK ;

MAPPER, D ;

HARDMAN, M ;

FARREN, J ;

ADAMS, L ;

HARBOESORENSEN, R .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1207-1211

← 1 2 →