CORRELATION OF ELECTRICAL CARRIER AND ATOMIC PROFILES OF MG IMPLANTS IN GAAS

被引：24

作者：

YEO, YK

PARK, YS

PEDROTTI, FL

CHOE, BD

机构：

[1] USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45443

[2] MARQUETTE UNIV,DEPT PHYS,MILWAUKEE,WI 53233

[3] SEOUL NATL UNIV,DEPT PHYS,SEOUL,SOUTH KOREA

来源：

JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 09期

关键词：

D O I：

10.1063/1.331579

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：6148 / 6153

页数：6

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