IMPROVEMENT OF GAS-SWITCHING ABRUPTNESS FOR ATMOSPHERIC-PRESSURE ORGANOMETALLIC VAPOR-PHASE EPITAXY

被引:7
作者
AGAHI, F [1 ]
LUTZ, CR [1 ]
LAU, KM [1 ]
机构
[1] UNIV MASSACHUSETTS,DEPT ELECT & COMP ENGN,COMPOUND SEMICOND LAB,AMHERST,MA 01003
关键词
D O I
10.1016/0022-0248(94)90186-4
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A simple gas dilution technique was implemented to minimize the limitations of the organometallic gas delivery manifold with a vent/run configuration in an organometallic vapor phase epitaxy (OMVPE) system. The dead space created in a switching valve upon closing can serve as a memory cell for the reactants. The importance of the problem depends on the volume and shape of the cavity. This paper reports on the effects of diluting the organometallic-saturated H-2 carrier gases before the switching valves. Significant improvement in intra-layer composition uniformity and interface abruptness of AlxGa1-xAs/GaAs quantum wells (QWs) was observed. Without the dilution flow, residual trimethylaluminum in the dead space of the switching valve resulted in a slow transition at the barrier and well interface, leading to graded heterojunctions and possibly aluminum incorporation in the well. Diluting the reactants with 50 SCCM of H-2 provided more abrupt interfaces and resulted in excellent agreement between the well width obtained by the scaled bulk growth rate and that calculated with photoluminescence data and a square well model.
引用
收藏
页码:344 / 350
页数:7
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