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ANALYTICAL APPLICATION OF TOTAL REFLECTION AND POLARIZED X-RAYS
被引:18
作者
:
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
WOBRAUSCHEK, P
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
AIGINGER, H
机构
:
来源
:
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE
|
1986年
/ 324卷
/ 08期
关键词
:
D O I
:
10.1007/BF00473182
中图分类号
:
O65 [分析化学];
学科分类号
:
070302 ;
081704 ;
摘要
:
引用
收藏
页码:865 / 874
页数:10
相关论文
共 16 条
[11]
TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS
[J].
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
机构:
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
WOBRAUSCHEK, P
;
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
机构:
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
AIGINGER, H
.
ANALYTICAL CHEMISTRY,
1975,
47
(06)
:852
-855
[12]
X-RAY-FLUORESCENCE ANALYSIS USING INTENSIVE LINEAR POLARIZED MONOCHROMATIC X-RAYS AFTER BRAGG REFLECTION
[J].
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
WOBRAUSCHEK, P
;
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
AIGINGER, H
.
X-RAY SPECTROMETRY,
1980,
9
(02)
:57
-59
[13]
X-RAY-FLUORESCENCE ANALYSIS WITH A LINEAR POLARIZED BEAM AFTER BRAGG REFLECTION FROM A FLAT OR A CURVED SINGLE-CRYSTAL
[J].
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
WOBRAUSCHEK, P
;
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
AIGINGER, H
.
X-RAY SPECTROMETRY,
1983,
12
(02)
:72
-78
[14]
OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS
[J].
YONEDA, Y
论文数:
0
引用数:
0
h-index:
0
YONEDA, Y
;
HORIUCHI, T
论文数:
0
引用数:
0
h-index:
0
HORIUCHI, T
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1971,
42
(07)
:1069
-&
[15]
[No title captured]
[16]
1972, IUPAC COMMISSION, V26, P17
←
1
2
→
共 16 条
[11]
TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS
[J].
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
机构:
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
WOBRAUSCHEK, P
;
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
机构:
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA
AIGINGER, H
.
ANALYTICAL CHEMISTRY,
1975,
47
(06)
:852
-855
[12]
X-RAY-FLUORESCENCE ANALYSIS USING INTENSIVE LINEAR POLARIZED MONOCHROMATIC X-RAYS AFTER BRAGG REFLECTION
[J].
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
WOBRAUSCHEK, P
;
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
AIGINGER, H
.
X-RAY SPECTROMETRY,
1980,
9
(02)
:57
-59
[13]
X-RAY-FLUORESCENCE ANALYSIS WITH A LINEAR POLARIZED BEAM AFTER BRAGG REFLECTION FROM A FLAT OR A CURVED SINGLE-CRYSTAL
[J].
WOBRAUSCHEK, P
论文数:
0
引用数:
0
h-index:
0
WOBRAUSCHEK, P
;
AIGINGER, H
论文数:
0
引用数:
0
h-index:
0
AIGINGER, H
.
X-RAY SPECTROMETRY,
1983,
12
(02)
:72
-78
[14]
OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS
[J].
YONEDA, Y
论文数:
0
引用数:
0
h-index:
0
YONEDA, Y
;
HORIUCHI, T
论文数:
0
引用数:
0
h-index:
0
HORIUCHI, T
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1971,
42
(07)
:1069
-&
[15]
[No title captured]
[16]
1972, IUPAC COMMISSION, V26, P17
←
1
2
→