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ANALYTICAL MODELING OF THE SUBTHRESHOLD CURRENT IN SHORT-CHANNEL MOSFETS
被引:10
作者
:
POOLE, DR
论文数:
0
引用数:
0
h-index:
0
POOLE, DR
KWONG, DL
论文数:
0
引用数:
0
h-index:
0
KWONG, DL
机构
:
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1986年
/ 7卷
/ 06期
关键词
:
D O I
:
10.1109/EDL.1986.26394
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:340 / 343
页数:4
相关论文
共 16 条
[1]
LOW-LEVEL CURRENTS IN INSULATED GATE FIELD-EFFECT TRANSISTORS
[J].
BARRON, MB
论文数:
0
引用数:
0
h-index:
0
BARRON, MB
.
SOLID-STATE ELECTRONICS,
1972,
15
(03)
:293
-+
[2]
GENERALIZED GUIDE FOR MOSFET MINIATURIZATION
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
;
FICHTNER, W
论文数:
0
引用数:
0
h-index:
0
FICHTNER, W
;
NICOLLIAN, EH
论文数:
0
引用数:
0
h-index:
0
NICOLLIAN, EH
;
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
.
ELECTRON DEVICE LETTERS,
1980,
1
(01)
:2
-4
[3]
SUB-THRESHOLD BEHAVIOR OF UNIFORMLY AND NONUNIFORMLY DOPED LONG-CHANNEL MOSFET
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
BREWS, JR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(09)
:1282
-1291
[4]
CHARGE-SHEET MODEL OF MOSFET
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
.
SOLID-STATE ELECTRONICS,
1978,
21
(02)
:345
-355
[5]
MOS MODELING BY ANALYTICAL APPROXIMATIONS .1. SUB-THRESHOLD CURRENT AND THRESHOLD VOLTAGE
[J].
FICHTNER, W
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
FICHTNER, W
;
POTZL, HW
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
POTZL, HW
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1979,
46
(01)
:33
-55
[6]
SUBTHRESHOLD DRAIN LEAKAGE CURRENTS IN MOS FIELD-EFFECT TRANSISTORS
[J].
GOSNEY, WM
论文数:
0
引用数:
0
h-index:
0
GOSNEY, WM
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(02)
:213
-&
[7]
TWO-DIMENSIONAL ANALYTICAL MODELING OF THRESHOLD VOLTAGES OF SHORT-CHANNEL MOSFETS
[J].
POOLE, DR
论文数:
0
引用数:
0
h-index:
0
POOLE, DR
;
KWONG, DL
论文数:
0
引用数:
0
h-index:
0
KWONG, DL
.
IEEE ELECTRON DEVICE LETTERS,
1984,
5
(11)
:443
-446
[8]
POON HC, 1974, ASILOMAR C PACIFIC G
[9]
CALIBRATED MODEL FOR THE SUB-THRESHOLD OPERATION OF A SHORT CHANNEL MOSFET INCLUDING SURFACE-STATES
[J].
SCOTT, DB
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Waterloo, Waterloo, Ont.
SCOTT, DB
;
CHAMBERLAIN, SG
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Waterloo, Waterloo, Ont.
CHAMBERLAIN, SG
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(03)
:633
-644
[10]
MINIMOS - A TWO-DIMENSIONAL MOS-TRANSISTOR ANALYZER
[J].
SELBERHERR, S
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
SELBERHERR, S
;
SCHUTZ, A
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
SCHUTZ, A
;
POTZL, HW
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
POTZL, HW
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
:1540
-1550
←
1
2
→
共 16 条
[1]
LOW-LEVEL CURRENTS IN INSULATED GATE FIELD-EFFECT TRANSISTORS
[J].
BARRON, MB
论文数:
0
引用数:
0
h-index:
0
BARRON, MB
.
SOLID-STATE ELECTRONICS,
1972,
15
(03)
:293
-+
[2]
GENERALIZED GUIDE FOR MOSFET MINIATURIZATION
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
;
FICHTNER, W
论文数:
0
引用数:
0
h-index:
0
FICHTNER, W
;
NICOLLIAN, EH
论文数:
0
引用数:
0
h-index:
0
NICOLLIAN, EH
;
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
.
ELECTRON DEVICE LETTERS,
1980,
1
(01)
:2
-4
[3]
SUB-THRESHOLD BEHAVIOR OF UNIFORMLY AND NONUNIFORMLY DOPED LONG-CHANNEL MOSFET
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
BREWS, JR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(09)
:1282
-1291
[4]
CHARGE-SHEET MODEL OF MOSFET
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
.
SOLID-STATE ELECTRONICS,
1978,
21
(02)
:345
-355
[5]
MOS MODELING BY ANALYTICAL APPROXIMATIONS .1. SUB-THRESHOLD CURRENT AND THRESHOLD VOLTAGE
[J].
FICHTNER, W
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
FICHTNER, W
;
POTZL, HW
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, A-1060 VIENNA, AUSTRIA
POTZL, HW
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1979,
46
(01)
:33
-55
[6]
SUBTHRESHOLD DRAIN LEAKAGE CURRENTS IN MOS FIELD-EFFECT TRANSISTORS
[J].
GOSNEY, WM
论文数:
0
引用数:
0
h-index:
0
GOSNEY, WM
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(02)
:213
-&
[7]
TWO-DIMENSIONAL ANALYTICAL MODELING OF THRESHOLD VOLTAGES OF SHORT-CHANNEL MOSFETS
[J].
POOLE, DR
论文数:
0
引用数:
0
h-index:
0
POOLE, DR
;
KWONG, DL
论文数:
0
引用数:
0
h-index:
0
KWONG, DL
.
IEEE ELECTRON DEVICE LETTERS,
1984,
5
(11)
:443
-446
[8]
POON HC, 1974, ASILOMAR C PACIFIC G
[9]
CALIBRATED MODEL FOR THE SUB-THRESHOLD OPERATION OF A SHORT CHANNEL MOSFET INCLUDING SURFACE-STATES
[J].
SCOTT, DB
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Waterloo, Waterloo, Ont.
SCOTT, DB
;
CHAMBERLAIN, SG
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Waterloo, Waterloo, Ont.
CHAMBERLAIN, SG
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(03)
:633
-644
[10]
MINIMOS - A TWO-DIMENSIONAL MOS-TRANSISTOR ANALYZER
[J].
SELBERHERR, S
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
SELBERHERR, S
;
SCHUTZ, A
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
SCHUTZ, A
;
POTZL, HW
论文数:
0
引用数:
0
h-index:
0
机构:
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
LUDWIG BOLTZMANN INST FESTKORPERPHYS, VIENNA, AUSTRIA
POTZL, HW
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
:1540
-1550
←
1
2
→