THE SURFACE GEOMETRY OF GAAS(110 - A RESPONSE

被引:41
作者
DUKE, CB
PATON, A
机构
关键词
D O I
10.1016/0039-6028(85)90695-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:L797 / L806
页数:10
相关论文
共 30 条
  • [1] SURFACE-STRUCTURE AND ORBITAL SYMMETRIES OF (110) SURFACE-STATES OF GAAS
    CHADI, DJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 631 - 636
  • [2] (110) SURFACE ATOMIC STRUCTURES OF COVALENT AND IONIC SEMICONDUCTORS
    CHADI, DJ
    [J]. PHYSICAL REVIEW B, 1979, 19 (04): : 2074 - 2082
  • [3] (110) SURFACE GEOMETRY OF GAAS
    CHADI, DJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (03): : 383 - 383
  • [4] (110) SURFACE-STATES OF GAAS AND MATRIX ELEMENT EFFECTS IN ANGLE-RESOLVED PHOTOEMISSION
    CHADI, DJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (04): : 1244 - 1248
  • [5] INTRINSIC UNOCCUPIED SURFACE-STATES AT GAAS(110)
    DOSE, V
    GOSSMANN, HJ
    STRAUB, D
    [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 387 - 393
  • [6] INVESTIGATION OF INTRINSIC UNOCCUPIED SURFACE-STATES AT GAAS(110) BY ISOCHROMAT SPECTROSCOPY
    DOSE, V
    GOSSMANN, HJ
    STRAUB, D
    [J]. PHYSICAL REVIEW LETTERS, 1981, 47 (08) : 608 - 610
  • [7] STRUCTURE DETERMINATION FOR THE (110) SURFACE OF ZINCBLENDE STRUCTURE COMPOUND SEMICONDUCTORS
    DUKE, CB
    MEYER, RJ
    PATON, A
    MARK, P
    KAHN, A
    SO, E
    YEH, JL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1252 - 1257
  • [8] ATOMIC GEOMETRY OF CLEAVAGE SURFACES OF TETRAHEDRALLY COORDINATED COMPOUND SEMICONDUCTORS
    DUKE, CB
    LUBINSKY, AR
    LEE, BW
    MARK, P
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 761 - 768
  • [9] DISPLACEMENTS PARALLEL TO THE SURFACE OF RECONSTRUCTED GAAS(110)
    DUKE, CB
    PATON, A
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (03): : 327 - 331
  • [10] DYNAMICAL ANALYSIS OF LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITIES FROM GAP(110)
    DUKE, CB
    PATON, A
    FORD, WK
    KAHN, A
    CARELLI, J
    [J]. PHYSICAL REVIEW B, 1981, 24 (02): : 562 - 573