CORRELATION BETWEEN CMOS TRANSISTOR AND CAPACITOR MEASUREMENTS OF INTERFACE TRAP SPECTRA

被引：14

作者：

RUSSELL, TJ

BENNETT, HS

GAITAN, M

SUEHLE, JS

ROITMAN, P

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期

关键词：

D O I：

10.1109/TNS.1986.4334583

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1228 / 1233

页数：6

共 17 条

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