RESONANT TUNNELING DEVICE WITH MULTIPLE NEGATIVE DIFFERENTIAL RESISTANCE - DIGITAL AND SIGNAL-PROCESSING APPLICATIONS WITH REDUCED CIRCUIT COMPLEXITY

被引：134

作者：

SEN, S ^{[1
]}

CAPASSO, F ^{[1
]}

CHO, AY ^{[1
]}

SIVCO, D ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 10期

关键词：

D O I：

10.1109/T-ED.1987.23215

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2185 / 2191

页数：7

共 19 条

[1] INVERTED BASE-COLLECTOR TUNNEL TRANSISTORS
BONNEFOI, AR
CHOW, DH
MCGILL, TC
[J]. APPLIED PHYSICS LETTERS, 1985, 47 (08) : 888 - 890
[2] MILLIMETER-BAND OSCILLATIONS BASED ON RESONANT TUNNELING IN A DOUBLE-BARRIER DIODE AT ROOM-TEMPERATURE
BROWN, ER
SOLLNER, TCLG
GOODHUE, WD
PARKER, CD
[J]. APPLIED PHYSICS LETTERS, 1987, 50 (02) : 83 - 85
[3] RESONANT TUNNELING TRANSISTOR WITH QUANTUM WELL BASE AND HIGH-ENERGY INJECTION - A NEW NEGATIVE DIFFERENTIAL RESISTANCE DEVICE
CAPASSO, F
KIEHL, RA
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (03) : 1366 - 1368
[4] QUANTUM-WELL RESONANT TUNNELING BIPOLAR-TRANSISTOR OPERATING AT ROOM-TEMPERATURE
CAPASSO, F
SEN, S
GOSSARD, AC
HUTCHINSON, AL
ENGLISH, JH
[J]. IEEE ELECTRON DEVICE LETTERS, 1986, 7 (10) : 573 - 576
[5] Capasso F., 1985, Picosecond Electronics and Optoelectronics. Proceedings of the Topical Meeting, P112
[6] RESONANT TUNNELING THROUGH DOUBLE BARRIERS, PERPENDICULAR QUANTUM TRANSPORT PHENOMENA IN SUPERLATTICES, AND THEIR DEVICE APPLICATIONS
CAPASSO, F
MOHAMMED, K
CHO, AY
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (09) : 1853 - 1869
[7] RESONANT TUNNELING GATE FIELD-EFFECT TRANSISTOR
CAPASSO, F
SEN, S
BELTRAM, F
CHO, AY
[J]. ELECTRONICS LETTERS, 1987, 23 (05) : 225 - 226
[8] Futatsugi T., 1986, International Electron Devices Meeting 1986. Technical Digest (Cat. No.86CH2381-2), P286
[9] Heilmeir G. H., 1984, International Electron Devices Meeting. Technical Digest (Cat. No. 84CH2099-0), P2
[10] AN ALL-CMOS TERNARY IDENTITY CELL FOR VLSI IMPLEMENTATION
HEUNG, A
MOUFTAH, HT
[J]. ELECTRONICS LETTERS, 1984, 20 (05) : 221 - 222

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