NOVEL RELAXATION PROCESS IN STRAINED SI/GE SUPERLATTICES GROWN ON GE(001)

被引:50
作者
WEGSCHEIDER, W [1 ]
EBERL, K [1 ]
ABSTREITER, G [1 ]
CERVA, H [1 ]
OPPOLZER, H [1 ]
机构
[1] SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
关键词
D O I
10.1063/1.103375
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new mode of misfit defect formation has been observed for the first time in high quality Si/Ge strained-layer superlattices grown by molecular beam epitaxy on Ge(001). In order to investigate the transition from coherent to incoherent growth we have studied a set of samples with a varying number of superlattice periods by transmission electron microscopy. High-resolution lattice imaging reveals that strain relaxation occurs through successive glide of 90°(a/6)〈211〉 Shockley partial dislocations on adjacent {111} planes. The resulting microtwins represent the only relaxation mechanism we observed in the samples.
引用
收藏
页码:1496 / 1498
页数:3
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