COMPARISON OF NUCLEAR AND OPTICAL METHODS IN THE STUDY OF AMORPHIZED SEMICONDUCTORS AND INSULATORS

被引：5

作者：

GOTZ, G

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 199卷 / 1-2期

关键词：

D O I：

10.1016/0167-5087(82)90177-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：61 / 73

页数：13

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