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KINK EFFECT, TRANSCONDUCTANCE INCREASE AND FIELD ENHANCED ELECTRON-EMISSION IN ALGAAS/GAAS HEMTS
被引:5
作者
:
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
CANALI, C
TEDESCO, C
论文数:
0
引用数:
0
h-index:
0
机构:
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
TEDESCO, C
ZANONI, E
论文数:
0
引用数:
0
h-index:
0
机构:
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
ZANONI, E
CASTELLANETA, G
论文数:
0
引用数:
0
h-index:
0
机构:
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
CASTELLANETA, G
MAGISTRALI, F
论文数:
0
引用数:
0
h-index:
0
机构:
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
MAGISTRALI, F
SANGALLI, M
论文数:
0
引用数:
0
h-index:
0
机构:
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
SANGALLI, M
机构
:
[1]
CSATA,TECNOPOLIS,I-70010 VALENZANO,ITALY
[2]
TELETTRA SPA,I-20159 VIMERCATE,ITALY
来源
:
ELECTRONICS LETTERS
|
1990年
/ 26卷
/ 18期
关键词
:
Gallium arsenide;
Semiconductor devices and materials;
D O I
:
10.1049/el:19900976
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
Experimental results obtained in depletion AIGaAs/GaAs HEMTs showing the presence of a remarkable increase of transconductance with frequency associated with a kink effect in the current-voltage curves is reported. Transconductance increase occurs at high frequencies with increasing drain source voltage. All these effects are ascribed to field enhanced electron emission from deep levels present in the AlGaAs layer. © 1990, The Institution of Electrical Engineers. All rights reserved.
引用
收藏
页码:1520 / 1522
页数:3
相关论文
共 9 条
[1]
BELHADJ A, 1989, 4TH P INT C QUAL EL, P128
[2]
ELECTRON DETRAPPING ENHANCED BY ELECTRIC-FIELD IN ALGAAS GAAS HEMTS
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
CANALI, C
TEDESCO, C
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TEDESCO, C
ZANONI, E
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
ZANONI, E
MAGISTRALI, F
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
MAGISTRALI, F
SANGALLI, M
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
SANGALLI, M
[J].
ELECTRONICS LETTERS,
1990,
26
(05)
: 313
-
315
[3]
CIRCILLO NC, 1986, IEEE ELECTRON DEVICE, V7, P71
[4]
BIAS DEPENDENCE AND LIGHT SENSITIVITY OF (AL,GA)AS/GAAS MODFETS AT 77-K
DRUMMOND, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
DRUMMOND, TJ
FISCHER, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
FISCHER, RJ
KOPP, WF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
KOPP, WF
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
MORKOC, H
LEE, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
LEE, K
SHUR, MS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
SHUR, MS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(12)
: 1806
-
1811
[5]
GODTS P, ELECTRON LETT, V24, P937
[6]
KINK EFFECT IN SUBMICROMETER-GATE MBE-GROWN INALAS/INGAAS/INALAS HETEROJUNCTION MESFETS
KUANG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
KUANG, JB
TASKER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
TASKER, PJ
WANG, GW
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
WANG, GW
CHEN, YK
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
CHEN, YK
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
EASTMAN, LF
AINA, OA
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
AINA, OA
HIER, H
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
HIER, H
FATHIMULLA, A
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
FATHIMULLA, A
[J].
IEEE ELECTRON DEVICE LETTERS,
1988,
9
(12)
: 630
-
632
[7]
TRAPPING CHARACTERISTICS AND A DONOR-COMPLEX (DX) MODEL FOR THE PERSISTENT PHOTOCONDUCTIVITY TRAPPING CENTER IN TE-DOPED ALXGA1-XAS
LANG, DV
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
LANG, DV
LOGAN, RA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
LOGAN, RA
JAROS, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
JAROS, M
[J].
PHYSICAL REVIEW B,
1979,
19
(02)
: 1015
-
1030
[8]
MARSHALL I, 1985, APPL PHYS LETT, V47, P628
[9]
OBSERVATION AND MECHANISM OF KINK EFFECT IN DEPLETION-MODE ALGAAS GAAS AND ALGAAS GAINAS HEMTS
THOMASIAN, A
论文数:
0
引用数:
0
h-index:
0
机构:
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
THOMASIAN, A
REZAZADEH, AA
论文数:
0
引用数:
0
h-index:
0
机构:
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
REZAZADEH, AA
HIPWOOD, LG
论文数:
0
引用数:
0
h-index:
0
机构:
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
HIPWOOD, LG
[J].
ELECTRONICS LETTERS,
1989,
25
(05)
: 351
-
353
←
1
→
共 9 条
[1]
BELHADJ A, 1989, 4TH P INT C QUAL EL, P128
[2]
ELECTRON DETRAPPING ENHANCED BY ELECTRIC-FIELD IN ALGAAS GAAS HEMTS
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
CANALI, C
TEDESCO, C
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TEDESCO, C
ZANONI, E
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
ZANONI, E
MAGISTRALI, F
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
MAGISTRALI, F
SANGALLI, M
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY
SANGALLI, M
[J].
ELECTRONICS LETTERS,
1990,
26
(05)
: 313
-
315
[3]
CIRCILLO NC, 1986, IEEE ELECTRON DEVICE, V7, P71
[4]
BIAS DEPENDENCE AND LIGHT SENSITIVITY OF (AL,GA)AS/GAAS MODFETS AT 77-K
DRUMMOND, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
DRUMMOND, TJ
FISCHER, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
FISCHER, RJ
KOPP, WF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
KOPP, WF
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
MORKOC, H
LEE, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
LEE, K
SHUR, MS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
SHUR, MS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(12)
: 1806
-
1811
[5]
GODTS P, ELECTRON LETT, V24, P937
[6]
KINK EFFECT IN SUBMICROMETER-GATE MBE-GROWN INALAS/INGAAS/INALAS HETEROJUNCTION MESFETS
KUANG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
KUANG, JB
TASKER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
TASKER, PJ
WANG, GW
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
WANG, GW
CHEN, YK
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
CHEN, YK
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
EASTMAN, LF
AINA, OA
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
AINA, OA
HIER, H
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
HIER, H
FATHIMULLA, A
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MICROELECTR INC,COLORADO SPRINGS,CO 80921
FATHIMULLA, A
[J].
IEEE ELECTRON DEVICE LETTERS,
1988,
9
(12)
: 630
-
632
[7]
TRAPPING CHARACTERISTICS AND A DONOR-COMPLEX (DX) MODEL FOR THE PERSISTENT PHOTOCONDUCTIVITY TRAPPING CENTER IN TE-DOPED ALXGA1-XAS
LANG, DV
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
LANG, DV
LOGAN, RA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
LOGAN, RA
JAROS, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
UNIV MASSACHUSETTS, DEPT PHYS & ASTRON, AMHERST, MA 01003 USA
JAROS, M
[J].
PHYSICAL REVIEW B,
1979,
19
(02)
: 1015
-
1030
[8]
MARSHALL I, 1985, APPL PHYS LETT, V47, P628
[9]
OBSERVATION AND MECHANISM OF KINK EFFECT IN DEPLETION-MODE ALGAAS GAAS AND ALGAAS GAINAS HEMTS
THOMASIAN, A
论文数:
0
引用数:
0
h-index:
0
机构:
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
THOMASIAN, A
REZAZADEH, AA
论文数:
0
引用数:
0
h-index:
0
机构:
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
REZAZADEH, AA
HIPWOOD, LG
论文数:
0
引用数:
0
h-index:
0
机构:
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
GEC,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
HIPWOOD, LG
[J].
ELECTRONICS LETTERS,
1989,
25
(05)
: 351
-
353
←
1
→