共 17 条
[1]
Abeles F., 1950, ANN PHYS-PARIS, V12, P596, DOI [DOI 10.1051/ANPHYS/195012050596, 10.1051/anphys/195012050596]
[2]
Abeles F, 1950, ANN PHYS-PARIS, V5, P706
[3]
X-RAY-DIFFRACTION IN A PERFECT CRYSTAL WITH DISTURBED SURFACE-LAYER
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1977, 42 (01)
:415-422
[4]
Born M., 1964, PRINCIPLES OPTICS, P51
[9]
DETERMINATION OF STRAIN DISTRIBUTIONS FROM X-RAY BRAGG REFLECTION BY SILICON SINGLE-CRYSTALS
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1977, 33 (JAN1)
:137-142
[10]
THE METHOD OF INTEGRAL CHARACTERISTICS IN X-RAY-DIFFRACTION STUDIES OF THE STRUCTURE OF THE SURFACE-LAYERS OF SINGLE-CRYSTALS
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1981, 64 (02)
:435-442