共 15 条
- [1] ADAR R, UNPUB
- [3] THE PHOTOCHEMICAL OXIDATION OF GAAS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (04) : 973 - 976
- [4] QUANTITATIVE AUGER ANALYSIS BY DEPTH PROFILING OF LINE-SHAPES - APPLICATION TO NATIVE OXIDE-INSB INTERFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (04): : 959 - 963
- [5] FOULER AM, 1987, OPT ENG, V26, P232
- [6] GIBBONS MD, 1983, P SPIE, V433, P151
- [8] CHARACTERIZATION OF IMPROVED INSB INTERFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1474 - 1477
- [9] NICOLLIAN EH, 1982, MOS PHYSICAL TECHNOL
- [10] HYSTERESIS FREE SIO2/INSB METAL-INSULATOR-SEMICONDUCTOR DIODES [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (06) : 2060 - 2066