X-RAY MULTIPLE DIFFRACTION AS A TOOL FOR STUDYING HETERO-EPITAXIAL LAYERS .1. COHERENT, ON-AXIS LAYERS

被引：22

作者：

ISHERWOOD, BJ ^{[1
]}

BROWN, BR ^{[1
]}

HALLIWELL, MAG ^{[1
]}

机构：

[1] BRITISH PO,RES CTR,IPSWICH,ENGLAND

来源：

JOURNAL OF CRYSTAL GROWTH | 1981年 / 54卷 / 03期

关键词：

D O I：

10.1016/0022-0248(81)90498-X

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：449 / 460

页数：12

共 22 条

[11]

ISHIDA K, 1975, PHYS STATUS SOLIDI A, V31, P225

[12]

Kossel W, 1935, ANN PHYS, V23, P677

[13] DIVERGENT-BEAM X-RAY PHOTOGRAPHY OF CRYSTALS [J].

LONSDALE, K .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1947, 240 (817) :219-&

[14]

MACKAY KJH, 1966, 4TH P INT C XRAY OPT, P544

[15] REDUCTION OF DISLOCATION DENSITIES IN HETEROEPITAXIAL III-V VPE SEMICONDUCTORS [J].

OLSEN, GH ;

ABRAHAMS, MS ;

BUIOCCHI, CJ ;

ZAMEROWSKI, TJ .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (04) :1643-1646

[16] PREPARATION OF MULTILAYER LPE HETEROSTRUCTURES WITH CRYSTALLINE SOLID SOLUTIONS OF ALXGA1-XAS - HETEROSTRUCTURE LASERS [J].

PANISH, MB ;

SUMSKI, S ;

HAYASHI, I .

METALLURGICAL TRANSACTIONS, 1971, 2 (03) :795-&

[17]

PENNING P, 1968, PHILIPS RES REP, V23, P12

[18]

PINSKER ZG, 1978, DYNAMICAL SCATTERING, pCH12

[19] ACCURATE LATTICE-CONSTANTS FROM MULTIPLE DIFFRACTION MEASUREMENTS .1. GEOMETRY, TECHNIQUES AND SYSTEMATIC-ERRORS [J].

POST, B .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (AUG1) :452-456

[20] INTERFACE STRESS OF ALXGA1-XAS-GAAS LAYER STRUCTURES [J].

REINHART, FK ;

LOGAN, RA .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (07) :3171-3175

← 1 2 3 →