STUDY OF ELECTRONIC LEVELS IN ANTIMONY AND INDIUM-DOPED GALLIUM-ARSENIDE

被引:34
作者
MITCHEL, WC [1 ]
YU, PW [1 ]
机构
[1] WRIGHT STATE UNIV, RES CTR, DAYTON, OH 45435 USA
关键词
D O I
10.1063/1.334751
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:623 / 625
页数:3
相关论文
共 16 条
  • [1] DISLOCATION-FREE GAAS AND INP CRYSTALS BY ISOELECTRONIC DOPING
    JACOB, G
    DUSEAUX, M
    FARGES, JP
    VANDENBOOM, MMB
    ROKSNOER, PJ
    [J]. JOURNAL OF CRYSTAL GROWTH, 1983, 61 (02) : 417 - 424
  • [2] JACOB G, 1982, SEMIINSULATING 3 5 M, P2
  • [3] STUDY OF 2 DIFFERENT DEEP LEVELS IN UNDOPED LEC SI-GAAS BY PHOTO-LUMINESCENCE SPECTROSCOPY
    KIKUTA, T
    TERASHIMA, K
    ISHIDA, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (07): : L409 - L411
  • [4] KIKUTA T, 1983, JPN J APPL PHYS, V22, pL539
  • [5] DEFECT NATURE OF THE 0.4-EV CENTER IN O-DOPED GAAS
    LOOK, DC
    CHAUDHURI, S
    SIZELOVE, JR
    [J]. APPLIED PHYSICS LETTERS, 1983, 42 (09) : 829 - 831
  • [6] RYTOVA NS, 1982, SOV PHYS SEMICOND+, V16, P951
  • [7] IMPURITY EFFECT ON GROWN-IN DISLOCATION DENSITY OF INP AND GAAS CRYSTALS
    SEKI, Y
    WATANABE, H
    MATSUI, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) : 822 - 828
  • [8] SOLOVEVA EV, 1981, SOV PHYS SEMICOND+, V15, P1243
  • [9] SOLOVEVA EV, 1982, SOV PHYS SEMICOND+, V16, P366
  • [10] TA LB, 1983, INST PHYS CONF SER, P31