共 16 条
- [2] JACOB G, 1982, SEMIINSULATING 3 5 M, P2
- [3] STUDY OF 2 DIFFERENT DEEP LEVELS IN UNDOPED LEC SI-GAAS BY PHOTO-LUMINESCENCE SPECTROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (07): : L409 - L411
- [4] KIKUTA T, 1983, JPN J APPL PHYS, V22, pL539
- [5] DEFECT NATURE OF THE 0.4-EV CENTER IN O-DOPED GAAS [J]. APPLIED PHYSICS LETTERS, 1983, 42 (09) : 829 - 831
- [6] RYTOVA NS, 1982, SOV PHYS SEMICOND+, V16, P951
- [8] SOLOVEVA EV, 1981, SOV PHYS SEMICOND+, V15, P1243
- [9] SOLOVEVA EV, 1982, SOV PHYS SEMICOND+, V16, P366
- [10] TA LB, 1983, INST PHYS CONF SER, P31