ENERGY RELAXATION EFFECT OF HOT-ELECTRONS IN GAAS

被引：36

作者：

ASHIDA, K ^{[1
]}

INOUE, M ^{[1
]}

SHIRAFUJI, J ^{[1
]}

INUISHI, Y ^{[1
]}

机构：

[1] OSAKA UNIV, FAC ENGN, DEPT ELECT ENGN, SUITA, OSAKA, JAPAN

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1974年 / 37卷 / 02期

关键词：

D O I：

10.1143/JPSJ.37.408

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：408 / 414

页数：7

共 14 条

[1] MICROWAVE MEASUREMENT OF VELOCITY-FIELD CHARACTERISTIC OF GAAS
BRASLAU, N
HAUGE, PS
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1970, ED17 (08) : 616 - +
[2] INTERVALLEY TRANSFER MECHANISM OF NEGATIVE RESISTIVITY IN BULK SEMICONDUCTORS
BUTCHER, PN
FAWCETT, W
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 86 (554P): : 1205 - &
[3] HIGH-FIELD TRANSPORT IN N-TYPE GAAS
CONWELL, EM
VASSELL, MO
[J]. PHYSICAL REVIEW, 1968, 166 (03): : 797 - +
[4] MONTE-CARLO DETERMINATION OF ELECTRON TRANSPORT PROPERTIES IN GALLIUM ARSENIDE
FAWCETT, W
BOARDMAN, AD
SWAIN, S
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1970, 31 (09) : 1963 - &
[5] HIGH-FIELD MICROWAVE PERMITTIVITY OF ELECTRONS IN BULK GAAS
GLOVER, GH
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5590 - &
[6] ERROR IN MICROWAVE MEASUREMENTS OF VELOCITY-FIELD CHARACTERISTIC OF N-TYPE GAAS DUE TO ENERGY RELAXATION EFFECTS
GLOVER, GH
[J]. APPLIED PHYSICS LETTERS, 1971, 18 (07) : 290 - +
[7] HARMONIC MIXING AND ENERGY RELAXATION OF WARM ELECTRONS IN N-GAAS AT LOW TEMPERATURES
HESS, K
KAHLERT, H
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1971, 32 (09) : 2262 - &
[8] HIGH-FREQUENCY BEHAVIOR OF ELECTRON-TRANSFER IN INP AND GAAS FROM A DYNAMICAL MONTE-CARLO STUDY
HILLBRAND, HA
[J]. JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1972, 5 (24): : 3491 - +
[9] TEMPERATURE DEPENDENCE OF VELOCITY-FIELD CHARACTERISTIC IN N-TYPE GAAS
INOUE, M
INUISHI, Y
SHIRAFUJI, J
NAKADE, Y
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1972, 32 (04) : 1010 - +
[10] MICROWAVE MEASUREMENT OF VELOCITY-FIELD CHARACTERISTICS IN N-TYPE GALLIUM ARSENIDE
INOUE, M
SHIRAFUJI, J
INUISHI, Y
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (10) : 1378 - +

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