PICOSECOND PHOTOCONDUCTIVITY MEASUREMENTS OF MOBILITY AND LIFETIME IN SILICON-ON-SAPPHIRE FILMS

被引：8

作者：

GRIVITSKAS, V

WILLANDER, M

TELLEFSEN, JA

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1984年 / 55卷 / 08期

关键词：

D O I：

10.1063/1.333346

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3169 / 3172

页数：4

共 11 条

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[8] PICOSECOND PHOTOCONDUCTIVITY IN RADIATION-DAMAGED SILICON-ON-SAPPHIRE FILMS [J].

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