ELLIPSOMETRIC INVESTIGATION OF METAL ALKALI-HALIDE INTERFACES

被引：1

作者：

BERMUDEZ, VM

机构：

来源：

PHYSICAL REVIEW B | 1985年 / 31卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.31.2491

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：2491 / 2493

页数：3

相关论文

共 33 条

[1] OPTICAL-PROPERTIES OF AU - SAMPLE EFFECTS
ASPNES, DE
KINSBRON, E
BACON, DD
[J]. PHYSICAL REVIEW B, 1980, 21 (08) : 3290 - 3299
[2] AU AND AL INTERFACE REACTIONS WITH SIO2
BAUER, RS
BACHRACH, RZ
BRILLSON, LJ
[J]. APPLIED PHYSICS LETTERS, 1980, 37 (11) : 1006 - 1008
[3] BERMUDEZ VD, UNPUB
[4] AIDER (ANGLE-OF-INCIDENCE DERIVATIVE ELLIPSOMETRY AND REFLECTOMETRY) - IMPLEMENTATION AND APPLICATION
BERMUDEZ, VM
[J]. SURFACE SCIENCE, 1980, 94 (01) : 29 - 40
[5] WAVELENGTH-SCANNING POLARIZATION-MODULATION ELLIPSOMETRY - SOME PRACTICAL CONSIDERATIONS
BERMUDEZ, VM
RITZ, VH
[J]. APPLIED OPTICS, 1978, 17 (04) : 542 - 552
[6] OXYGEN-ADSORPTION ON THE INDIUM-ANTIMONIDE (110) SURFACE
BERMUDEZ, VM
RITZ, VH
[J]. PHYSICAL REVIEW B, 1982, 26 (06): : 3297 - 3308
[7] EFFECT OF SAMPLE IMPERFECTIONS IN WAVELENGTH-SCANNING POLARIZATION-MODULATION ELLIPSOMETRY
BERMUDEZ, VM
[J]. OPTICS COMMUNICATIONS, 1977, 23 (03) : 413 - 418
[8] BERMUDEZ VM, 1978, OPT COMMUN, V24, P366
[9] VACUUM ULTRAVIOLET RADIATION-DAMAGE OF KCI SURFACE - APPLICATION OF COMBINED SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY
BERMUDEZ, VM
[J]. SURFACE SCIENCE, 1978, 74 (03) : 568 - 594
[10] THE STRUCTURE AND PROPERTIES OF METAL-SEMICONDUCTOR INTERFACES
Brillson, L. J.
[J]. SURFACE SCIENCE REPORTS, 1982, 2 (02) : 123 - 326

← 1 2 3 4 →