OXIDATION OF SI(111)-(7X7) AS STUDIED BY SCANNING TUNNELING MICROSCOPY

被引：87

作者：

LEIBSLE, FM ^{[1
]}

SAMSAVAR, A ^{[1
]}

CHIANG, TC ^{[1
]}

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.38.5780

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5780 / 5783

页数：4

共 20 条

[1] TUNNELING MICROSCOPY OF SILICON AND GERMANIUM - SI(111) 7X7, SNGE(111) 7X7, GESI(111) 5X5, SI(111) 9X9, GE(111) 2X8, GE(100) 2X1, SI(110) 5X1
BECKER, RS
SWARTZENTRUBER, BS
VICKERS, JS
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 472 - 477
[2] NEW RECONSTRUCTIONS ON SILICON (111) SURFACES
BECKER, RS
GOLOVCHENKO, JA
HIGASHI, GS
SWARTZENTRUBER, BS
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (08) : 1020 - 1023
[3] TUNNELING IMAGES OF ATOMIC STEPS ON THE SI(111)7X7 SURFACE
BECKER, RS
GOLOVCHENKO, JA
MCRAE, EG
SWARTZENTRUBER, BS
[J]. PHYSICAL REVIEW LETTERS, 1985, 55 (19) : 2028 - 2031
[4] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
BINNIG, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[5] A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES
DEMUTH, JE
HAMERS, RJ
TROMP, RM
WELLAND, ME
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1320 - 1323
[6] A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES
DEMUTH, JE
HAMERS, RJ
TROMP, RM
WELLAND, ME
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 396 - 402
[7] SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE
HAMERS, RJ
TROMP, RM
DEMUTH, JE
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (18) : 1972 - 1975
[8] MULTIPLE-BONDING CONFIGURATIONS FOR OXYGEN ON SILICON SURFACES
HOLLINGER, G
HIMPSEL, FJ
[J]. PHYSICAL REVIEW B, 1983, 28 (06) : 3651 - 3653
[9] SCANNING-TUNNELING-MICROSCOPE OBSERVATION OF SURFACE-DIFFUSION ON AN ATOMIC SCALE - AU ON AU(111)
JAKLEVIC, RC
ELIE, L
[J]. PHYSICAL REVIEW LETTERS, 1988, 60 (02) : 120 - 123
[10] APPARENT SIZE OF AN ATOM IN THE SCANNING TUNNELING MICROSCOPE AS A FUNCTION OF BIAS
LANG, ND
[J]. PHYSICAL REVIEW LETTERS, 1987, 58 (01) : 45 - 48

← 1 2 →