STRUCTURE OF THE SI(111)/CAF2 INTERFACE

[1] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY - REPLY [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (19) : 2275 - 2275

[2] EVIDENCE FOR THE INFLUENCE OF INTERFACIAL ATOMIC-STRUCTURE ON ELECTRICAL-PROPERTIES AT THE EPITAXIAL CAF2/SI(111) INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1988, 60 (14) : 1394 - 1397

[3] TRANSFORMATION OF 3-CONNECTED SILICON NETS IN CASI2 [J]. JOURNAL OF SOLID STATE CHEMISTRY, 1979, 28 (03) : 369 - 377

[4] DETERMINATION OF INTERFACE STATES FOR CAF2/SI(111) FROM NEAR-EDGE X-RAY-ABSORPTION MEASUREMENTS [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (14) : 1497 - 1500

[5] HIMPSEL FJ, 1987, MATER RES SOC S P, V94, P181

[6] PHOTOEMISSION-STUDY OF BONDING AT THE CAF2-ON-SI(111) INTERFACE [J]. PHYSICAL REVIEW B, 1987, 35 (14): : 7526 - 7532

[7] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CAF2/SILICON INTERFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (04): : 1121 - 1122

[8] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (19) : 2274 - 2274

[9] STRUCTURE OF THE SI(111)-CAF2 INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (15) : 1756 - 1759

[1] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY - REPLY [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (19) : 2275 - 2275

[2] EVIDENCE FOR THE INFLUENCE OF INTERFACIAL ATOMIC-STRUCTURE ON ELECTRICAL-PROPERTIES AT THE EPITAXIAL CAF2/SI(111) INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1988, 60 (14) : 1394 - 1397

[3] TRANSFORMATION OF 3-CONNECTED SILICON NETS IN CASI2 [J]. JOURNAL OF SOLID STATE CHEMISTRY, 1979, 28 (03) : 369 - 377

[4] DETERMINATION OF INTERFACE STATES FOR CAF2/SI(111) FROM NEAR-EDGE X-RAY-ABSORPTION MEASUREMENTS [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (14) : 1497 - 1500

[5] HIMPSEL FJ, 1987, MATER RES SOC S P, V94, P181

[6] PHOTOEMISSION-STUDY OF BONDING AT THE CAF2-ON-SI(111) INTERFACE [J]. PHYSICAL REVIEW B, 1987, 35 (14): : 7526 - 7532

[7] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CAF2/SILICON INTERFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (04): : 1121 - 1122

[8] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (19) : 2274 - 2274

[9] STRUCTURE OF THE SI(111)-CAF2 INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (15) : 1756 - 1759