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DISTRIBUTION OF DOPANT IN SIO2-SI
被引:3
作者
:
AVRON, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,HOPEWELL JUNCTION,NY 12533
AVRON, M
SHATZKES, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,HOPEWELL JUNCTION,NY 12533
SHATZKES, M
BURKHARDT, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,HOPEWELL JUNCTION,NY 12533
BURKHARDT, PJ
CADOFF, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,HOPEWELL JUNCTION,NY 12533
CADOFF, I
机构
:
[1]
IBM CORP,DIV SYST PROD,HOPEWELL JUNCTION,NY 12533
[2]
POLYTECH INST BROOKLYN,DEPT MET & MAT SCI,BROOKLYN,NY 11201
来源
:
JOURNAL OF APPLIED PHYSICS
|
1976年
/ 47卷
/ 07期
关键词
:
D O I
:
10.1063/1.323110
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:3159 / 3166
页数:8
相关论文
共 22 条
[1]
ABRAMOWITZ M, 1964, HDB MATH FUNCTIONS, P298
[2]
BURKHARDT PJ, 1966, T METALL SOC AIME, V236, P299
[3]
IMPURITY REDISTRIBUTION IN A SEMICONDUCTOR DURING THERMAL OXIDATION
CHEN, WH
论文数:
0
引用数:
0
h-index:
0
CHEN, WH
CHEN, WS
论文数:
0
引用数:
0
h-index:
0
CHEN, WS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(12)
: 1297
-
&
[4]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[5]
THE OXIDATION OF SILICON IN DRY OXYGEN, WET OXYGEN, AND STEAM
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(06)
: 527
-
533
[6]
OBSERVATION OF IMPURITY REDUSTRIBUTION DURING THERMAL OXIDATION OF SILICON USING MOS STRUCTURE
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
SNOW, EH
论文数:
0
引用数:
0
h-index:
0
SNOW, EH
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(03)
: 308
-
&
[7]
EDAGAWA H, 1963, JPN J APPL PHYS, V2, P765
[8]
GDULA RA, COMMUNICATION
[9]
REDISTRIBUTION OF ACCEPTOR + DONOR IMPURITIES DURING THERMAL OXIDATION OF SILICON
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
LEISTIKO, O
论文数:
0
引用数:
0
h-index:
0
LEISTIKO, O
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(09)
: 2695
-
&
[10]
CALCULATION OF SPREADING RESISTANCE CORRECTION FACTORS
HU, SM
论文数:
0
引用数:
0
h-index:
0
HU, SM
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(07)
: 809
-
&
←
1
2
3
→
共 22 条
[1]
ABRAMOWITZ M, 1964, HDB MATH FUNCTIONS, P298
[2]
BURKHARDT PJ, 1966, T METALL SOC AIME, V236, P299
[3]
IMPURITY REDISTRIBUTION IN A SEMICONDUCTOR DURING THERMAL OXIDATION
CHEN, WH
论文数:
0
引用数:
0
h-index:
0
CHEN, WH
CHEN, WS
论文数:
0
引用数:
0
h-index:
0
CHEN, WS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(12)
: 1297
-
&
[4]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[5]
THE OXIDATION OF SILICON IN DRY OXYGEN, WET OXYGEN, AND STEAM
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(06)
: 527
-
533
[6]
OBSERVATION OF IMPURITY REDUSTRIBUTION DURING THERMAL OXIDATION OF SILICON USING MOS STRUCTURE
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
SNOW, EH
论文数:
0
引用数:
0
h-index:
0
SNOW, EH
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(03)
: 308
-
&
[7]
EDAGAWA H, 1963, JPN J APPL PHYS, V2, P765
[8]
GDULA RA, COMMUNICATION
[9]
REDISTRIBUTION OF ACCEPTOR + DONOR IMPURITIES DURING THERMAL OXIDATION OF SILICON
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
LEISTIKO, O
论文数:
0
引用数:
0
h-index:
0
LEISTIKO, O
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(09)
: 2695
-
&
[10]
CALCULATION OF SPREADING RESISTANCE CORRECTION FACTORS
HU, SM
论文数:
0
引用数:
0
h-index:
0
HU, SM
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(07)
: 809
-
&
←
1
2
3
→