X-RAY PROBE MICROANALYSES AND SCANNING-X-RAY MICROSCOPIES

[1] PHOTOELECTRON SPECTROMICROSCOPY [J]. NATURE, 1981, 290 (5807) : 556 - 561

[2] BOOKER CR, 1970, MODERN DIFFRACTION I, P553

[3] CASTAING R, 1962, CR HEBD ACAD SCI, V255, P76

[4] CASTAING R, 1952, THESIS PARIS

[5] X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES [J]. REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (05): : 263 - 280

[6] CAZAUX J, 1982, APPL SURF SCI, V10, P124, DOI 10.1016/0378-5963(82)90140-4

[7] SIMULTANEOUS BULK AND SURFACE MICROANALYSIS BY ELECTRON-SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1981, 38 (12) : 1021 - 1023

[8] ELECTRON-MICROSCOPE FOR SURFACE CHEMICAL-ANALYSIS [J]. REVUE DE PHYSIQUE APPLIQUEE, 1973, 8 (04): : 371 - 381

[9] SCANNING-X-RAY RADIOGRAPHY - 1ST TESTS IN AN ELECTRON SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (04) : 3299 - 3302

[10] CAZAUX J, 1982, I PHYS C SER, V61, P425

[1] PHOTOELECTRON SPECTROMICROSCOPY [J]. NATURE, 1981, 290 (5807) : 556 - 561

[2] BOOKER CR, 1970, MODERN DIFFRACTION I, P553

[3] CASTAING R, 1962, CR HEBD ACAD SCI, V255, P76

[4] CASTAING R, 1952, THESIS PARIS

[5] X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES [J]. REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (05): : 263 - 280

[6] CAZAUX J, 1982, APPL SURF SCI, V10, P124, DOI 10.1016/0378-5963(82)90140-4

[7] SIMULTANEOUS BULK AND SURFACE MICROANALYSIS BY ELECTRON-SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1981, 38 (12) : 1021 - 1023

[8] ELECTRON-MICROSCOPE FOR SURFACE CHEMICAL-ANALYSIS [J]. REVUE DE PHYSIQUE APPLIQUEE, 1973, 8 (04): : 371 - 381

[9] SCANNING-X-RAY RADIOGRAPHY - 1ST TESTS IN AN ELECTRON SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (04) : 3299 - 3302

[10] CAZAUX J, 1982, I PHYS C SER, V61, P425