SIMULTANEOUS BULK AND SURFACE MICROANALYSIS BY ELECTRON-SPECTROSCOPY

被引：10

作者：

CAZAUX, J

MOUZE, D

PERRIN, J

THOMAS, X

机构：

来源：

关键词：

D O I：

10.1063/1.92229

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1021 / 1023

页数：3

共 13 条

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[3] CAZAUX J, 1977, J PHYS LETT-PARIS, V38, pL473
[4] CAZAUX J, 1980, THIN FILMS, V1, P291
[5] ESCA DEVICE AS SOFT-X-RAY SPECTROMETER
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[6] MEASUREMENTS OF K,L AND M SHELL X-RAY PRODUCTION EFFICIENCIES
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COSSLETT, VE
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (04) : 425 - &
[7] HOVLAND CT, 1977, 7TH P INT VAC C 3RD, P2363
[8] KRAUSE MO, 1973, ADV XRAY ANAL, V16, P74
[9] DETERMINATION OF L-ALPHA1,2 AND L-BETA X-RAY-EMISSION SPECTRUM OF IRON USING A PHOTOELECTRON SPECTROMETER
MONTAGUE, PM
URCH, DS
[J]. NATURE, 1978, 272 (5656) : 804 - 806
[10] QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
POWELL, CJ
LARSON, PE
[J]. APPLIED SURFACE SCIENCE, 1978, 1 (02) : 186 - 201