EXPERIMENTAL STUDY OF ZEEMAN SPLITTING OF BORON LEVELS IN SILICON

被引：28

作者：

MERLET, F ^{[1
]}

PAJOT, B ^{[1
]}

ARCAS, P ^{[1
]}

JEANLOUIS, AM ^{[1
]}

机构：

[1] UNIV PARIS 06, CNRS, LAB INFRAROUGE, BATIMENT 350, 91405 ORSAY, FRANCE

来源：

PHYSICAL REVIEW B | 1975年 / 12卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.12.3297

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3297 / 3317

页数：21

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